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Supporting fully customizable controls of every sensor, gimbal function and pan tilt size to your specifications.
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Optimized for advanced manufacturing and quality control, this SWIR inspection solution reveals material characteristics invisible to standard visible cameras. It enables accurate moisture detection, silicon wafer inspection, and plastic material differentiation, improving production reliability and consistency.
High-sensitivity SWIR sensor for spectral differentiation
Enhanced contrast for moisture and material detection
Compatibility with industrial optical assemblies
Stable performance under high-temperature background conditions
Machine vision interface support
High repeatability for automated inspection
Compact, integration-ready mechanical design
Semiconductor wafer inspection
Silicon defect analysis
Lithium battery electrode moisture detection
Agricultural product moisture analysis
Plastic sorting and recycling systems
Food processing quality control